實驗室主要設備

  • X光繞射儀
  • 儀器廠牌及型號:PANalytical X'Pert Pro MRD

  • X-ray光源:銅靶 (Cu Ka λ= 0.15418 nm)

  • 測角儀系統: 2θ作動範圍: -40˚ to 220˚最小步徑 0.001˚

  • 偵測器Solid-state array detector

 

(預約使用 - 興大貴儀系統)

 

 

  • 傅氏轉換紅外光譜儀 (FTIR Spectrometer)

    • Transmission methods

    • Reflection methods

      • External reflection method

      • Diffuse reflection method (DRIFT)

      • Attenuated total reflection method (ATR)

  • 壓片機與壓片盒 (Pellet press and die)

     

    • 粉末樣品分析
 
  • 衰減全反射套件(Attenuated total reflection)

    • Trough plate, ZnSe 45 degree

    • Flat plate, ZnSe 45 degree

    • Flow cell, ZnSe 45 degree

    • Temperature controlled flow cell, ZnSe 45 degree

  • 反射分析套件

    • External reflection (powder, thin film, solution)

    • Diffuse reflection (powder sample)

    • Attenuated total reflection (powder, paste, thin film, solution)

     

  • 氣體樣品槽 (Gas cell)

    • 10-cm pathlength transmission gas cell

    • Two ports allow static and flow transmission measurements

  • 液體樣品槽 (Demountable liquid cell)

  • 溫控液體樣品槽 (Temperature controlled demountable liquid cell)
    • Variable pathlength, from 6µm to 1mm

    • Heatable to 200°C and coolable to -80°C

    • Two ports permit static or flow applications

    • Chemically resistant 316 stainless steel cell body with Luer Lok fittings

  • Brewster's angle sample holder
  • 離子層析儀

  • 自動滴定裝置

  • 軟體:
    • Geochemist's Workbench

    • Systat

    • GRAMS AI

    • CrystalMaker

    • CrystalDiffract

    • X-Win

    • LabView

    • SigmaPlot

    • OriginLab

    • KaleidaGraph